Ian Kearney brings over 23 years of specialized experience in driving reliability excellence for enterprise hardware. As a technical authority in the Physics-of-Failure (PoF) and semiconductor deprocessing, he has directed forensic investigations across global R&D and high-volume manufacturing environments. His background encompasses the execution of advanced diagnostic methodologies—from LWIR Lock-In Thermography to multi-scale physical analysis—to isolate complex, intermittent faults.
Holding a Master of Engineering Science in Semiconductor Lasers and a Bachelor of Engineering in Electrical and Electronics Engineering, his foundation is built on rigorous physical analysis. Operating at the intersection of microscopic defect isolation and macro-level infrastructure resilience, he has guided the transition of flawed theoretical assumptions into empirical fatigue modeling for autonomous ground systems, evaluated complex semiconductor intellectual property, and diagnosed critical design weaknesses in high-current Power MOSFET portfolios. He is based in Washington, D.C..
Meridian OCC operates with discretion and precision. For technical due diligence, forensic failure analysis, or reliability strategy inquiries, reach out directly.
Location: Virginia / Washington, D.C.
Direct Inquiry: ian@meridianocc.com
Phone: 835-215-2693
Professional Network: linkedin.com/in/ian-kearney